Description: A total burn-spectrographic method has been applied to the determination of trace concentrations of silicon in plutonium. The sample is oxidized to plutonium dioxide, mixed with a germanium dioxide-graphite mixture containing tin internal standard, packed into cupped graphite electrodes, and burned to completion in a high amperage direct current arc. Plutonium spectral interference is minimized by optical means and by use of a less intense silicon line. The sensitivity is thereby decreased but is still sufficient to determine 25 ppm of silicon in plutonium. The precision of the method is estimated to be �8% (relative standard deviation) at the 270 ppm level and �14% at 40 ppm.
Date: July 1, 1965
Creator: Ko, Roy
Item Type: Refine your search to only Report
Partner: UNT Libraries Government Documents Department