Description: Low-temperature measurements of muonium parameters in various germanium crystals have been performed. We have measured crystals with different levels of neutral impurities, with and without dislocations, and with different annealing histories. The most striking result is the apparent trapping of Mu by silicon impurities in germanium.
Date: April 1, 1983
Creator: Clawson, C.W.; Crowe, K.M.; Haller, E.E.; Rosenblum, S.S. & Brewer, J.H.
Item Type: Refine your search to only Article
Partner: UNT Libraries Government Documents Department