Initiative to Further Develop X-Ray Microbeam Capabilites and Facilities for Scientific and Industrial Applications
Description:
Microbeam Diffraction Equipment which gives the ability to measure the complete strain tensor in polycrystalline thin metal films in a completely automated fashion.
Date:
June 20, 2005
Creator:
Batterman, Boris, kW
Item Type:
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Report
Partner:
UNT Libraries Government Documents Department