Initiative to Further Develop X-Ray Microbeam Capabilites and Facilities for Scientific and Industrial Applications
Description: Microbeam Diffraction Equipment which gives the ability to measure the complete strain tensor in polycrystalline thin metal films in a completely automated fashion.
Date: June 20, 2005
Creator: Batterman, Boris, kW
Item Type: Refine your search to only Report
Partner: UNT Libraries Government Documents Department