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Operator scheduling at the Advanced Light Source

Description: Scheduling Operations staff at the Advanced Light Source (ALS) has evolved from 5 shifts/week for commissioning operations in 1992 to the present 24 hour/day, 21 shift coverage as the ALS went to full operation for users. A number of schedules were developed and implemented in an effort to accommodate changing ALS shift coverage requirements. The present work schedule and the lessons learned, address a number of issues that are useful to any facility that is operating 24 hours/day, 7 days/week.
Date: June 1998
Creator: Miller, B.
Partner: UNT Libraries Government Documents Department

Commissioning of the advanced light source dual-axis streak camera

Description: A dual-axis camera, Hamamatsu model C5680, has been installed on the Advanced Light Source photon-diagnostics beam-line to investigate electron-beam parameters. During its commissioning process, the camera has been used to measure single-bunch length vs. current, relative bunch charge in adjacent RF buckets, and bunchphase stability. In this paper the authors describe the visible-light branch of the diagnostics beam-line, the streak-camera installation, and the timing electronics. They will show graphical results of beam measurements taken during a variety of accelerator conditions.
Date: May 1997
Creator: Hinkson, J.; Keller, R. & Byrd, J.
Partner: UNT Libraries Government Documents Department

Soft x-ray optics for spectromicroscopy at the Advanced Light Source

Description: A variety of systems for performing spectromicroscopy, spatially resolved spectroscopy, are in operation or under construction at the Advanced Light Source (ALS). For example, part of the program is centered around the surface analysis problems of local semiconductor industries, and this has required the construction of a microscope with wafer handling, fiducialization, optical microscopy, coordinated ion beam etching, and X-ray Photoelectron Spectroscopy (XPS) integrated in this case with Kirkpatrick-Baez (K-B) grazing incidence micro-focusing optics. The microscope is to be used in conjunction with a highly efficient entrance slitless Spherical Grating Monochromator (SGM). The design and expected performance of this instrument will be described, with emphasis on the production of the elliptically curved surfaces of the K-B mirrors by elastic bending of flat mirror substrates. For higher resolution, zone-plate (Z-P) focusing optics are used and one instrument, a Scanning Transmission X-ray Microscope (STXM) is in routine operation on undulator beamline 7.0. A second Z-P based system is being commissioned on the same beamline, and differs from the STXM in that it will operate at Ultra-High Vacuum (UHV) and will be able to perform XPS at 0.1 {micro}m spatial resolution. Spatially resolved X-ray Absorption Spectroscopy (XAS) can be performed by imaging electrons photoemitted from a material with a Photo-Emission Electron Microscope (PEEM). The optical requirements of a beamline designed for PEEM are very different to those of micro-focus systems and they give examples of bending magnet and undulator based instruments.
Date: September 1996
Creator: Padmore, H.A.
Partner: UNT Libraries Government Documents Department

Interactions of structural defects with metallic impurities in multicrystalline silicon

Description: Interactions between structural defects and metallic impurities were studied in multicrystalline silicon for solar cells applications. The objective was to gain insight into the relationship between solar cell processing, metallic impurity behavior and the resultant effect on material/device performance. With an intense synchrotron x-ray source, high sensitivity x-ray fluorescence measurements were utilized to determine impurity distributions with a spatial resolution of {approx} 1{micro}m. Diffusion length mapping and final solar cell characteristics gauged material/device performance. The materials were tested in both the as-grown state and after full solar cell processing. Iron and nickel metal impurities were located at structural defects in as-grown material, while after solar cell processing, both impurities were still observed in low performance regions. These results indicate that multicrystalline silicon solar cell performance is directly related to metal impurities which are not completely removed during typical processing treatments. A discussion of possible mechanisms for this incomplete removal is presented.
Date: November 1996
Creator: McHugo, S.A.; Hieslmair, H.; Weber, E.R.; Rosenblum, M.D. & Kalejs, J.P.
Partner: UNT Libraries Government Documents Department

High-resolution structural studies of ultra-thin magnetic, transition metal overlayers and two-dimensional transition metal oxides using synchrotron radiation

Description: This thesis report the surface-structure determination of three, ultra-thin magnetic transition-metal films, Fe/Au(100), Mn/Ni(100), and Mn/Cu(100) using Angle-Resolved Photoemission Extended Fine Structure (ARPEFS) and photoelectron holography. These structural studies are the first to use non-s initial states in the ARPEFS procedure. This thesis also reports an ARPEFS surface-structure determination of a two-dimensional transition-metal oxide, [(1 x 1)O/W(110)] x 12. The authors have analyzed the ARPFES signal from the Au 4f{sub 7/5} core level of the Au(1 ML)/Fe(15 ML)/Au(100) system. The analysis shows that the Fe grows layer by layer with one monolayer of gold, acting as a surfactant, remaining on top of the growing Fe layers. These surface gold atoms sit in the four-fold hollow site, 1.67 {+-} 0.02 A above the iron surface. The grown Fe layer is very much like the bulk, bcc iron, with an interlayer spacing of 1.43 {+-} 0.03 A. Analysis of the Mn 3p ARPEFS signals from c(2 x 2)Mn/Ni(100) and c(2 x 2)Mn/Cu(100) shows that the Mn forms highly corrugated surface alloys. The corrugation of the Mn/Ni(100) and Mn/Cu(100) systems are 0.24 {+-} 0.02 A and 0.30 {+-} 0.04 A respectively. In both cases the Mn is sticking above the plane of the surface substrate atoms. For the Mn/Ni(100) system the first layer Ni is contracted 4% from the bulk value. The Mn/Cu(100) system shows bulk spacing for the substrate Cu. Photoelectron holography shows that the Mn/Ni interface is very abrupt with very little Mn leaking into the second layer, while the Mn/Cu(100) case has a significant amount of Mn leaking into the second layer. A new, five-element electrostatic electron lens was developed for hemispherical electron-energy analyzers. This lens system can be operated at constant transverse or constants angular magnification, and has been optimized for use with the very small photon-spot sizes. Improvements ...
Date: May 1997
Creator: Kellar, S. A.
Partner: UNT Libraries Government Documents Department

A code for calculating intrabeam scattering and beam lifetime

Description: Beam emittances in a circular accelerator with a high beam intensity are strongly affected by the small angle intrabeam Coulomb scattering. In the computer simulation model the authors present here they used three coupled nonlinear differential equations to describe the evolution of the emittances in the transverse and the longitudinal planes. These equations include terms which take into account the intra-beam scattering, adiabatic damping, microwave instabilities, synchrotron damping, and quantum excitations. A code is generated to solve the equations numerically and incorporated into a FORTRAN code library. Circular high intensity physics routines are included in the library such as intrabeam scattering, Touschek scattering, and the bunch lengthening effect of higher harmonic cavities. The code runs presently in the PC environment. Description of the code and some examples are presented.
Date: May 1997
Creator: Kim, C.H.
Partner: UNT Libraries Government Documents Department

Performance of the VUV high resolution and high flux beamline for chemical dynamics studies at the Advanced Light Source

Description: At the Advanced Light Source an undulator beamline, with an energy range from 6 to 30 eV, has been constructed for chemical dynamics experiments. The higher harmonics of the undulator are suppressed by a novel, windowless gas filter. In one branchline high flux, 2 % bandwidth radiation is directed toward an end station for photodissociation and crossed molecular beam experiments. A photon flux of photon/sec has been measured at this end station. In a second branchline a 6.65 m off- plane Eagle monochromator delivers narrow bandwidth radiation to an end station for photoionization studies. At this second end station a peak flux of 3 x 10{sup 11} was observed for 25,000 resolving power. This monochromator has achieved a resolving power of 70,000 using a 4800 grooves/mm grating, one of the highest resolving powers obtained by a VUV monochromator.
Date: July 1996
Creator: Heimann, P. A.; Koike, M.; Hsu, C. W.; Evans, M.; Ng, C. Y.; Blank, D. et al.
Partner: UNT Libraries Government Documents Department

Electron beam diagnostics using synchrotron radiation at the Advanced Light Source

Description: Synchrotron light emitted from a bend magnet is being used to diagnose the electron beam stored in the main accelerator of the Advanced Light Source (ALS) at Berkeley Lab. The radiation has maximum intensity in the soft X-ray region and is imaged by a Kirkpatrick-Baez mirror pair from the source point inside the ring onto a Bismuth/Germanium-Oxide (BGO) crystal, converted into visible light and magnified by an attached microscope. The final image is captured by a TV camera-tube and digitized by a frame- grabber device to obtain records of parameters such as beam size, center location and profile. Data obtained from this Diagnostic Beam Line have been very useful in day-to-day operation of the ALS storage ring to assess the quality and repeatability of the stored beam. The line has further been utilized in several dedicated research activities to measure bunch lengths under various conditions and observe transverse beam instabilities. A summary of obtained results is given in this paper , together with a description of the technical features of the Diagnostic Beam Line.
Date: May 1996
Creator: Keller, R.; Renner, T. & Massoletti, D. J.
Partner: UNT Libraries Government Documents Department

Mechanical design of a pinger system for the LBNL Advanced Light Source Accelerator

Description: A fast magnet ''Pinger System'' has been designed for the Advanced Light Source 1.9 GeV electron Storage Ring. Intended for beam dynamics studies, its purpose is to provide a fast (< 600 ns) transverse magnetic field pulse to perturb the orbit of an electron bunch in a single turn. A key component is the special resistive-coated ceramic beam tube which is needed for fast magnetic field penetration. The evolution of the design concept is described, with emphasis on simplifications to provide an economical and mechanically robust device.
Date: May 1997
Creator: Thur, W.; Akre, J.; Gavidia, A. & Guigli, J.
Partner: UNT Libraries Government Documents Department

Crossed elliptical polarization undulator

Description: The first switching of polarization direction is possible by installing two identical helical undulators in series in a same straight section in a storage ring. By setting each undulator in a circular polarization mode in opposite handedness, one can obtain linearly polarized radiation with any required polarization direction depending on the modulator setting between two undulators. This scheme can be used without any major degradation of polarization degree in any low energy low emittance storage ring.
Date: May 1997
Creator: Sasaki, Shigemi
Partner: UNT Libraries Government Documents Department

S-shaped magnetic macroparticle filter for cathodic arc deposition

Description: A new magnetic macroparticle filter design consisting of two 90{sup o} filters forming an S-shape is described. Transport properties of this S-filter are investigated using Langmuir and deposition probes. It is shown that filter efficiency is product of the efficiencies of two 90{sup o} filters and the deposition rate is still acceptably high to perform thin film deposition. Films of amorphous hard carbon have been deposited using a 90{sup o} filter and the S-filter, and macroparticle content of the films are compared.
Date: April 1996
Creator: Anders, S.; Anders, A.; Dickinson, M.R.; MacGill, R.A. & Brown, I.G.
Partner: UNT Libraries Government Documents Department

Measurement of the radiation incident on ALS NdFeB permanent magnet insertion device structures and a determination of their lifetime

Description: Measurements of the radiation incident on ALS insertion device NdFeB permanent magnet structures were carried out using thermoluminescence dosimeters. A plastic scintillator gamma telescope was utilized to unravel the various contributions to the integrated dose. Magnet lifetimes were calculated for various operational conditions.
Date: May 1, 1997
Creator: Krebs, G.F. & Holmes, M.
Partner: UNT Libraries Government Documents Department

Grain orientation mapping of passivated aluminum interconnect lines with X-ray micro-diffraction

Description: A micro x-ray diffraction facility is under development at the Advanced Light Source. Spot sizes are typically about 1-{micro}m size generated by means of grazing incidence Kirkpatrick-Baez focusing mirrors. Photon energy is either white of energy range 6--14 keV or monochromatic generated from a pair of channel cut crystals. Laue diffraction pattern from a single grain in a passivated 2-{micro}m wide bamboo structured Aluminum interconnect line has been recorded. Acquisition times are of the order of seconds. The Laue pattern has allowed the determination of the crystallographic orientation of individual grains along the line length. The experimental and analysis procedure used is described, as is the latest grain orientation result. The impact of x-ray micro-diffraction and its possible future direction are discussed in the context of other developments in the area of electromigration, and other technological problems.
Date: September 1998
Creator: Chang, C. H.; Patel, J. R.; MacDowell, A. A.; Padmore, H. A. & Thompson, A. C.
Partner: UNT Libraries Government Documents Department

The interfacial and surface properties of thin Fe and Gd films grown on W(110) as studied by scanning tunneling microscopy, site-resolved photoelectron diffraction, and spin polarized photoelectron diffraction

Description: Combined scanning tunneling microscopy (STM) and low energy electron diffraction (LEED) measurements from Gd films grown on W(110) prepared with and without annealing have been used to provide a detailed picture of the growth of such films, permitting a quantitative structural explanation for previously-measured magnetic properties and the identification of a new two-dimensional structure for the first monolayer. The analysis of the film roughness of room-temperature-grown films as a function of coverage and lateral length scale reveals that the growing Gd surface follows scaling laws for a self-affine surface. Annealing these as-deposited films at elevated temperatures is found to drastically alter the morphology of the films, as seen by both STM and LEED. Nanometer-scale islands of relatively well-defined size and shape are observed under certain conditions. Finally, the first monolayer of Gd is observed to form a (7x14) superstructure with pseudo-(7x7) symmetry that is consistent with a minimally-distorted hexagonal two-dimensional Gd(0001) film. Furthermore, a new beamline and photoelectron spectrometer/diffractometer at the Advanced Light Source have been used to obtain full-solid-angle and site-specific photoelectron diffraction (PD) data from interface W atoms just beneath (1x1) Fe and (7x14) Gd monolayers on W(110) by utilizing the core level shift in the W 4f{sub 7/2} spectrum. A comparison of experiment with multiple scattering calculations permits determining the Fe adsorption site and the relative interlayer spacing to the first and second W layers. These Fe results are also compared to those from the very different Gd overlayer and from the clean W(110) surface. Such interface PD measurements show considerable promise for future studies. Finally, the rare-earth ferromagnetic system of Gd(0001) has been examined through the use of spin polarized photoelectron diffraction from the Gd 4s and 5s photoelectron multiplets.
Date: June 1997
Creator: Tober, E. D.
Partner: UNT Libraries Government Documents Department

Some new schemes for producing high-accuracy elliptical X-ray mirrors by elastic bending

Description: Although x-ray micro-foci can be produced by a variety of diffractive methods, grazing incidence mirrors are the only route to an achromatic focus. In this paper we describe our efforts to produce elliptically shaped mirrors with the very high figure accuracy necessary for producing a micro-focus. The motivation for this work is provided by the need to produce achromatic foci for a range of applications ranging from tunable micro-focus x-ray photoelectron spectroscopy ({mu}-XPS) at soft x-ray energies to micro-focus white beam x-ray diffraction ({mu}-XRD) at hard x-ray energies. We describe the methodology of beam bending, a practical example of a system we have produced for {mu}-XRD, and results demonstrating the production of a surface with micro-radian figure accuracy.
Date: August 1996
Creator: Padmore, H. A.; Howells, M. R.; Irick, S.; Renner, T.; Sandler, R. & Koo, Y.-M.
Partner: UNT Libraries Government Documents Department

Proceedings of the workshop on high resolution computed microtomography (CMT)

Description: The purpose of the workshop was to determine the status of the field, to define instrumental and computational requirements, and to establish minimum specifications required by possible users. The most important message sent by implementers was the remainder that CMT is a tool. It solves a wide spectrum of scientific problems and is complementary to other microscopy techniques, with certain important advantages that the other methods do not have. High-resolution CMT can be used non-invasively and non-destructively to study a variety of hierarchical three-dimensional microstructures, which in turn control body function. X-ray computed microtomography can also be used at the frontiers of physics, in the study of granular systems, for example. With high-resolution CMT, for example, three-dimensional pore geometries and topologies of soils and rocks can be obtained readily and implemented directly in transport models. In turn, these geometries can be used to calculate fundamental physical properties, such as permeability and electrical conductivity, from first principles. Clearly, use of the high-resolution CMT technique will contribute tremendously to the advancement of current R and D technologies in the production, transport, storage, and utilization of oil and natural gas. It can also be applied to problems related to environmental pollution, particularly to spilling and seepage of hazardous chemicals into the Earth's subsurface. Applications to energy and environmental problems will be far-ranging and may soon extend to disciplines such as materials science--where the method can be used in the manufacture of porous ceramics, filament-resin composites, and microelectronics components--and to biomedicine, where it could be used to design biocompatible materials such as artificial bones, contact lenses, or medication-releasing implants. Selected papers are indexed separately for inclusion in the Energy Science and Technology Database.
Date: February 1997
Partner: UNT Libraries Government Documents Department

Error reduction techniques for measuring long synchrotron mirrors

Description: Many instruments and techniques are used for measuring long mirror surfaces. A Fizeau interferometer may be used to measure mirrors much longer than the interferometer aperture size by using grazing incidence at the mirror surface and analyzing the light reflected from a flat end mirror. Advantages of this technique are data acquisition speed and use of a common instrument. Disadvantages are reduced sampling interval, uncertainty of tangential position, and sagittal/tangential aspect ratio other than unity. Also, deep aspheric surfaces cannot be measured on a Fizeau interferometer without a specially made fringe nulling holographic plate. Other scanning instruments have been developed for measuring height, slope, or curvature profiles of the surface, but lack accuracy for very long scans required for X-ray synchrotron mirrors. The Long Trace Profiler (LTP) was developed specifically for long x-ray mirror measurement, and still outperforms other instruments, especially for aspheres. Thus, this paper focuses on error reduction techniques for the LTP.
Date: July 1998
Creator: Irick, S.
Partner: UNT Libraries Government Documents Department

Progress towards sub-micron hard x-ray imaging using elliptically bent mirrors and its applications

Description: The authors have developed an x-ray micro-probe facility utilizing mirror bending techniques that allow white light x-rays (4--12keV) from the Advanced light Source Synchrotron to be focused down to spot sizes of micron spatial dimensions. They have installed a 4 crystal monochromator prior to the micro-focusing mirrors. The monochromator is designed such that it can move out of the way of the input beam, and allows the same micron sized sample to be illuminated with either white or monochromatic radiation. Illumination of the sample with white light allows for elemental mapping and Laue x-ray diffraction, while illumination of the sample with monochromatic light allows for elemental mapping (with reduced background), micro-X-ray absorption spectroscopy and micro-diffraction. The performance of the system will be described as will some of the initial experiments that cover the various disciplines of Earth, Material and Life Sciences.
Date: June 1998
Creator: MacDowell, A. A.; Lamble, G. M.; Celestre, R. S.; Padmore, H. A.; Chang, C. H. & Patel, J. R.
Partner: UNT Libraries Government Documents Department

Advanced Light Source activity report 1996/97

Description: Ten years ago, the Advanced Light Source (ALS) existed as a set of drawings, calculations, and ideas. Four years ago, it stored an electron beam for the first time. Today, the ALS has moved from those ideas and beginnings to a robust, third-generation synchrotron user facility, with eighteen beam lines in use, many more in planning or construction phases, and hundreds of users from around the world. Progress from concepts to realities is continuous as the scientific program, already strong in many diverse areas, moves in new directions to meet the needs of researchers into the next century. ALS staff members who develop and maintain the infrastructure for this research are similarly unwilling to rest on their laurels. As a result, the quality of the photon beams the authors deliver, as well as the support they provide to users, continues to improve. The ALS Activity Report is designed to share the results of these efforts in an accessible form for a broad audience. The Scientific Program section, while not comprehensive, shares the breadth, variety, and interest of recent research at the ALS. (The Compendium of User Abstracts and Technical Reports provides a more comprehensive and more technical view.) The Facility Report highlights progress in operations, ongoing accelerator research and development, and beamline instrumentation efforts. Although these Activity Report sections are separate, in practice the achievements of staff and users at the ALS are inseparable. User-staff collaboration is essential as they strive to meet the needs of the user community and to continue the ALS's success as a premier research facility.
Date: September 1997
Partner: UNT Libraries Government Documents Department

Study of hard disk and slider surfaces using X-ray photoemission electron microscopy and near-edge X-ray absorption fine structure spectroscopy

Description: X-ray Photo Emission Electron Microscopy (X-PEEM) and Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy were applied to study the properties of amorphous hard carbon overcoats on disks and sliders, and the properties of the lubricant. The modification of lubricants after performing thermal desorption studies was measured by NEXAFS, and the results are compared to the thermal desorption data. The study of lubricant degradation in wear tracks is described. Sliders were investigated before and after wear test, and the modification of the slider coating as well as the transfer of lubricant to the slider was studied. The studies show that the lubricant is altered chemically during the wear. Fluorine is removed and carboxyl groups are formed.
Date: April 1998
Creator: Anders, S.; Stammler, T.; Bhatia, C. S.; Stoehr, J.; Fong, W.; Chen, C. Y. et al.
Partner: UNT Libraries Government Documents Department

X-ray photoemission electron microscopy for the study of semiconductor materials

Description: Photoemission Electron Microscopy (PEEM) using X-rays is a novel combination of two established materials analysis techniques--PEEM using UV light, and Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy. This combination allows the study of elemental composition and bonding structure of the sample by NEXAFS spectroscopy with a high spatial resolution given by the microscope. A simple, two lens, 10 kV operation voltage PEEM has been used at the Stanford Synchrotron Radiation Laboratory and at the Advanced Light Source (ALS) in Berkeley to study various problems including materials of interest for the semiconductor industry. In the present paper the authors give a short overview over the method and the instrument which was used, and describe in detail a number of applications. These applications include the study of the different phases of titanium disilicide, various phases of boron nitride, and the analysis of small particles. A brief outlook is given on possible new fields of application of the PEEM technique, and the development of new PEEM instruments.
Date: March 1998
Creator: Anders, S.; Stammler, T.; Padmore, H.; Terminello, L. J.; Jankowski, A. F.; Stohr, J. et al.
Partner: UNT Libraries Government Documents Department

Measurement of diffraction gratings with a long trace profiler with applications for synchrotron beamline gratings

Description: The Long Trace Profiler (LTP) is used primarily for measuring the figure of long synchrotron beamline mirrors. The LTP has also been used for measuring the figure of the substrate of beamline gratings. We propose a method for measuring the effective figure that comes from the gratings groove pattern on the substrate of long beamline gratings. Analysis of gratings groove patterns can be useful in determining cause of poor imaging of the diffracted light, but requires investigation of small changes of the groove frequency over the entire clear aperture of the grating. A diffraction grating that is small enough to be measured by a general purpose six inch aperture interferometer is measured by both this interferometer and the LTP, so that results for two different instruments may be compared. The height profile of the substrate light (m = 0) measurement is subtracted from the height profile of the diffracted light (m = 1) measurement, and the result is the effect of only the diffraction f rom the grooves along the entire surface. This procedure is also used for a diffraction grating that is too long to be measured by the general purpose interferometer, but is easily measured by the LTP.
Date: June 1997
Creator: Irick, S.C. & McKinney, W.R.
Partner: UNT Libraries Government Documents Department

Ultra-thin overcoats for the head/disk interface tribology

Description: Areal density in magnetic storage is increasing at a blistering pace of 60% annually. Recently IBM announced its mobile product with the industry highest areal density of 2.64 Gb/In{sup 2}. The areal density demonstrations have shown up to 5 Gb/In{sup 2} possible. Reaching higher areal density targets dictate that magnetic spacing between heads and disks be reduced. For the example of a 10 Gb/In{sup 2} areal density goal, the magnetic spacing should be {approx}25 nm. In budgeting this magnetic spacing, it is required that disk and slider air bearing surface overcoats thickness be reduced to 5 nm range. Present choice of carbon overcoat in the magnetic storage hard disk drive industry is sputter deposited, hydrogenated carbon (CH{sub x}) with thickness in the range of 12-15 nm on heads and disks. Novel overcoats such as nitrogenated carbon (CN{sub x}) and cathodic arc carbon films are being developed for future applications. Cathodic arc deposition forms ultra-thin amorphous hard carbon films of high sp{sup 3} content, high hardness, and low coefficient of friction. These properties make it of great interest for head/disk interface application, in particular for contact recording. In many cases, the tribological properties of the head disk interface could be improved by factors up to ten applying cathodic arc overcoats to the slider or disk surface. This paper reviews the results of cathodic arc ultra-thin (2-10 nm) carbon overcoats for head/disk interface tribological applications.
Date: May 1997
Creator: Bhatia, C. S.; Anders, S. & Brown, I. G.
Partner: UNT Libraries Government Documents Department