Application of analytical electron microscopy to the study of intergranular corrosion in 304 stainless steel
Description: The technique of analytical electron microscopy in a scanning transmission electron microscope fitted with an energy dispersive x-ray spectrometer is used to measure the chromium depletion in sensitized 304 stainless steel along the grain boundaries. It is shown that such measurements could be misleading unless care is taken to properly choose the regions on the grain boundaries for such analysis.
Date: January 1, 1980
Creator: Pande, C S & Sabatini, R L
Item Type: Refine your search to only Article
Partner: UNT Libraries Government Documents Department