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in creator/contributor: "te Velthuis, S. G. E."  
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Exchange bias studied with polarized neutron reflectivity

Description: The role of Polarized Neutron Reflectivity (PNR) for studying natural and synthetic exchange biased systems is illustrated. For a partially oxidized thin film of Co, cycling of the magnetic field causes a considerable reduction of the bias, which the onset of diffuse neutron scattering shows to be due to the loosening of the ferromagnetic domains. On the other hand, PNR measurements of a model exchange bias junction consisting of an n-layered Fe/Cr antiferromagnetic (AF) superlattice coupled wi… more
Date: January 5, 2000
Creator: te Velthuis, S. G. E.
Item Type: Refine your search to only Article
Partner: UNT Libraries Government Documents Department
open access

Magnetic Profiles in Ferromagnetic/Superconducting Superlattices.

Description: The interplay between ferromagnetism and superconductivity has been of longstanding fundamental research interest to scientists, as the competition between these generally mutually exclusive types of long-range order gives rise to a rich variety of physical phenomena. A method of studying these exciting effects is by investigating artificially layered systems, i.e. alternating deposition of superconducting and ferromagnetic thin films on a substrate, which enables a straight-forward combination… more
Date: February 28, 2007
Creator: te Velthuis, S. G. E.; Hoffmann, A.; Santamaria, J.; Division, Materials Science & Madrid, Univ. Complutense de
Item Type: Refine your search to only Report
Partner: UNT Libraries Government Documents Department
open access

Spin-echo resolved grazing incidence scattering (ESRGIS) of cold neutrons.

Description: The conceptual design of a new instrument is presented, which makes use of the spin echo technique to analyze the scattering angle of neutrons impinging upon a rough or corrugated surface at grazing incidence. In a grazing incidence geometry the roughness of the surface and of submersed interfaces give rise to a neutron scattering pattern at angles well resolved from that of specular reflection for corrugation lengths up to several microns, but only in the plane of specular reflection. In contr… more
Date: August 12, 2002
Creator: Felcher, G. P.; te Velthuis, S. G. E.; Major, J.; Dosch, H.; Anderson, C.; Habicht, K. et al.
Item Type: Refine your search to only Article
Partner: UNT Libraries Government Documents Department
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