DC Scanning Field Emission Microscope Integrated with Existing Scanning Electron Microscope
Description:
Electron field emission (FE) from broad-area metal surfaces is known to occur at much lower electric field than predicted by Fowler-Nordheim law. Although micron or submicron particles are often observed at such enhanced field emission (EFE) sites, the strength and number of emitting sites and the causes of EFE strongly depend on surface preparation and handling, and the physical mechanism of EFE remains unknown. To systematically investigate the sources of this emission, a DC scanning field em…
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Date:
March 1, 2002
Creator:
Wang, Tong; Reece, Charles E. & Sundelin, Ronald M.
Item Type:
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UNT Libraries Government Documents Department