We demonstrate the limitations of using retarded (bisulfite) developer to abate film sensitivity of x-ray films that have been exposed to intense radiation. We compared the measured densities of a large number of Kodak Type-M x-ray film samples exposed to a known fluence of monochromatic x-rays. These film samples were processed in three separate batches of bisulfite developer mixed in the same proportions. We concluded that reproducible film-density information cannot be obtained using different batches of (bisulfite) developer solutions.
In an attempt to correlate x ray reflectivity with carbon mirror surface quality the relative reflectivity of five mirrors of different smoothness and optical flatness is compared. Measured and theoretical reflectivity values are in agreement for mirror smoothness <30 A and optical flatness <1000 A. Other correlation could not be established. 4 references.