Automated laser scatter detection of surface and subsurface defects in Si{sub 3}N{sub 4} components
Description:
Silicon Nitride (Si{sub 3}N{sub 4}) ceramics are currently a primary material of choice to replace conventional materials in many structural applications because of their oxidation resistance and desirable mechanical and thermal properties at elevated temperatures. However, surface or near-subsurface defects, such as cracks, voids, or inclusions, significantly affect component lifetimes. These defects are currently difficult to detect, so a technique is desired for the rapid automated detection…
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Date:
June 1995
Creator:
Steckenrider, J. S.
Item Type:
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Report
Partner:
UNT Libraries Government Documents Department