Description: A high-resolution, time-resolving soft X-ray multichannel spectrometer (SOXMOS) that permits the simultaneous measurement of emission in two different spectral ranges has been developed and tested extensively for tokamak plasma diagnostics. The basic instrument is a high-resolution, interferometrically adjusted, extreme grazing incidence Schwob-Fraenkel duochromator. The instrument is equipped with two multichannel detectors that are adjusted interferometrically and scan along the Rowland circle. Each consists of an MgF/sub 2/ coated, funneled microchannel plate, associated with a phosphor screen image intensifier that is coupled to a 1024-element photodiode array by a flexible fibrer optic conduit. The total wavelength coverage of the instrument is 5 to 340/sup 0/ A with a measured resolution (FWHM) of about 0.2 A when equipped with a 600 g/mm grating, and 5 to 85 A with a resolution of about 0.06 A using a 2400 g/mm grating. The simultaneous spectral coverage of each detector varies from 15 A at the short wavelength limit to 70 A at the long wavelength limit with the lower dispersion grating. The minimum read-out time for a full spectral portion is 17 ms, but several individual lines can be measured with 1 ms time resolution by selected pixel readout. Higher time resolution can be achieved by replacing one multichannel detector with a single channel electron multiplier detector. Examples of data from the PLT and TFTR tokamaks are presented to illustrate the instrument's versatility, high spectral resolution, and high signal-to-noise ratio even in the 10 A region. 44 refs., 20 figs.
Date: March 1, 1987
Creator: Schwob, J.L.; Wouters, A.W. & Suckewer, S.
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