In situ real-time studies of oxygen incorporation in complex oxide thin films using spectroscopic ellipsometry and ion scattering and recoil spectrometry.
Description: No abstract prepared.
Date: August 30, 2000
Creator: Mueller, A.H.; Gao, Y.; Irene, E.A.; Auciello, O.; Krauss, A.R. & Schultz, J.A.
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