Surface characterization of ceramic materials. [LEED, AES, XPS, ion scattering spectroscopy, secondary ion mass spectroscopy]
Description: In recent years several techniques have become available to characterize the structure and chemical composition of surfaces of ceramic materials. These techniques utilize electron scattering and scattering of ions from surfaces. Low-energy electron diffraction is used to determine the surface structure, Auger electron spectroscopy and other techniques of electron spectroscopy (ultraviolet and photoelectron spectroscopies) are employed to determine the composition of the surface. In addition the oxidation state of surface atoms may be determined using these techniques. Ion scattering mass spectrometry and secondary ion mass spectrometry are also useful in characterizing surfaces and their reactions. These techniques, their applications and the results of recent studies are discussed. 12 figures, 52 references, 2 tables.
Date: September 24, 1976
Creator: Somorjai, G. A. & Salmeron, M.
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