Infrared spectroscopic, x-ray, and nanoscale characterization of strontium titanate thin films
Description:
Attenuated total reflectance (ATR) measurements were performed using Fourier transform infrared (FTIR) spectroscopy in the ATR mode with a thallium iodobromide (KRS-5) crystal to measure the frequencies of the {nu}{sub 3} and {nu}{sub 4} phonon absorption bands in thin strontium titanate films deposited on single-crystal yttrium-barium copper oxide (YBCO), lanthanum aluminate, magnesium oxide, and strontium titanate substrates. The KRS-5 crystal enabled FTIR-ATR measurements to be made at frequ…
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Date:
April 1, 1996
Creator:
Webb, J. D.; Moutinho, H. R.; Kazmerski, L. L.; Mueller, C. H.; Rivkin, T. V.; Treece, R. E. et al.
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