Sub-Angstrom transmission electron microscopy at 300keV
Description:
We have demonstrated sub-Angstrom TEM to a resolution of 0.78 Angstrom with the one-Angstrom microscope (OAM) project at the National Center for Electron Microscopy. The OAM combines a modified CM300FEG-UT with computer software able to generate sub-Angstrom images from experimental image series. We achieved sub-Angstrom resolution with the OAM by paying close attention to detail. We placed the TEM in a favorable environment. We reduced its three-fold astigmatism A2 from 2.46mm to 300 Angstrom …
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Date:
February 14, 2001
Creator:
O'Keefe, Michael A.; Nelson, E. Christian; Turner, John H. & Thust, Andreas
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