Detection of Infrared Photons Using the Electronic Stress in Metal-Semiconductor Interfaces
Description:
It is well known that the work function of metals decreases when they are placed in a nonpolar liquid. A similar decrease occurs when the metal is placed into contact with a semiconductor forming a Schottky barrier. We report on a new method for detecting photons using the stress caused by photo-electrons emitted from a metal film surface in contact with a semiconductor microstructure. The photoelectrons diffuse into the microstructure and produce an electronic stress. The photon detection resu…
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Date:
April 5, 1999
Creator:
Datskos, P. G.; Datskou, I.; Egert, C. M. & Rjic, S.
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Partner:
UNT Libraries Government Documents Department