X-Ray Diffraction Project Final Report, Fiscal Year 2006
Description:
An x-ray diffraction diagnostic system was developed for determining real-time shock-driven lattice parameter shifts in single crystals at the gas gun at TA-IV at Sandia National Laboratories (SNL). The signal-to-noise ratio and resolution of the system were measured using imaging plates as the detector and by varying the slit width. This report includes tests of the x-ray diffraction system using a phosphor coupled to a charge-coupled device (CCD) camera by a coherent fiber-optic bundle. The s…
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Date:
October 1, 2006
Creator:
Morgan, Dane V.
Item Type:
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Report
Partner:
UNT Libraries Government Documents Department