Description: The atom probe field-ion microscope (APFIM) is a unique analytical instrument that can analyze metals and semiconducting materials on the atomic scale. In recent years, the atom probe has developed into one of the most powerful instruments available for routine microstructural and microchemical analysis of materials. The types of investigations that have been performed have encompassed many diverse metallurgical subjects including phase transformations, segregation, diffusion, catalysis, and radiation damage. 3 refs., 3 figs.
Date: January 1, 1987
Creator: Miller, M.K.
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