Reflection Mode Imaging with High Resolution X-rayMicroscopy
Description:
We report on the first demonstration of imaging microstructures with soft x-ray microscopy operating in reflection geometry. X-ray microscopy in reflection mode combines the high resolution available with x-ray optics, the ability to image thick samples, and to directly image surfaces and interfaces. Future experiments with this geometry will include tuning the incident angle to obtain depth resolution. In combination with XMCD as magnetic contrast mechanism this mode will allow studies of deep…
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Date:
April 2, 2005
Creator:
Denbeaux, Greg; Fischer, Peter; Salmassi, Farhad; Dunn, Kathleen & Evertsen, James
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Partner:
UNT Libraries Government Documents Department