Laser conditioning study of KDP on the optical sciences laser using large area beams
Description:
Considerable attention has been paid over the years to the problem of growing high purity KDP and KD*P to meet threshold requirements on succeeding generations of inertial confinement fusion lasers at LLNL. While damage thresholds for these materials have increased over time, the current National Ignition Facility (NIF) maximum fluence requirement (redline) for KD*P frequency triplers of 14.3 J/cm{sup 2} at 351 nm, 3 ns has not been reached without laser (pre)conditioning. It is reasonable to assume that, despite the rapid increase in damage thresholds for rapidly grown crystals, -a program of large scale conditioning of the 192 NIF triplers will be required. Small area ramp (R/1) tests on single sites indicate that KDP damage thresholds can be raised on average up to 1.5X the unconditioned values. Unpublished LLNL 3{omega} raster conditioning studies on KDP, however, have not conclusively shown that off-line conditioning is feasible for KD*P. Consequently, investigating the feasibility of on-line conditioning of NIF triplers at 3{omega} has become a high priority for the KDP damage group at LLNL. To investigate the feasibility of on-line conditioning we performed a series of experiments using the Optical Sciences Laser (OSL) on numerous samples of conventional and rapid growth KDP and KD*P. The experiment entailed exposing sites on each sample to a range of ramped shot (N/l) sequences starting at average fluences of -2 J/cm{sup 2} (in a 7 mm ``top hat`` beam @ 351 nm, 3 ns) up to peak fluences of approximately 13 J/cm{sup 2}. Test results indicated that the most effective conditioning procedure entailed a 7-8 shot ramp starting at 2 J/cm{sup 2} and ending at 12-13 J/cm{sup 2}. The pinpoint onset fluence for the 8/1 tests was 1.4 times that of the unconditioned site. Damage evolution appears to be exponential as a function of increasing fluence. When ...
Date:
December 20, 1997
Creator:
Runkel, M.; DeYoreo, J.; Sell, W. & Milam, D.
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