Microanalysis by electron energy loss spectroscopy at 300kV
Description:
Some features of the anticipated improvements in microanalysis by electron energy loss spectroscopy (EELS) at 300 kV compared to opeation at 100kV have been studied with the use of a Philips EM430T equipped with Gatan 607 EELS and EDAX 9100/70 systems. Detailed measurements have been made on a range of specimens, with emphasis on boron nitride and silicon carbide.
Date:
January 1, 1986
Creator:
Bentley, J. & Angelini, P.
Item Type:
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Partner:
UNT Libraries Government Documents Department