Undulator based scanning microscope at the National Synchrotron Light Source
Description:
A second generation scanning soft x-ray microscope is under construction, designed to utilize the dramatic increase in source bightness available at the soft x-ray undulator. The new instrument is expected to reduce image acquisition time by a factor of about 100, and to improve resolution, stability, and reproducibility.
Date:
January 1, 1986
Creator:
Rarback, H.; Shu, D.; Ade, H.; Jacobsen, C.; Kirz, J.; McNulty, I. et al.
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UNT Libraries Government Documents Department