X-ray measurements of stresses and defects in EFG and large grained polycrystalline silicon ribbons. First quarterly report
Description:
The first model of a modified Bond goniometer has been built and tested for the precision measurement of interplanar spacings in Si-single crystals. A change in interplanar spacing ..delta..d/d approximately = to +- 10/sup -5/ can be detected which corresponds to surface stresses of the order of +- 1000 psi. A second version of the goniometer is being assembled incorporating a removable microscope for precision alignment of the Si-strip into the primary X-ray beam.
Date:
January 1, 1978
Creator:
Wagner, C.N.J.
Item Type:
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Partner:
UNT Libraries Government Documents Department