Detection of Subsurface Defects Using X-Ray Lateral Migration Radiography - A New Backscatter Imaging Technique
Description:
A new Compton X-ray backscatter imaging technique called lateral migration radiography (LMR) is applied to detecting a class of sub-surface defects in materials and structures of industrial importance. These include flaws and defects for which there is either no known method or an effective method for detection. Examples are delamination in layered composite structures, defects in deposited coatings on metal surfaces such as in aircraft jet engine components and geometrical structural/compositi…
more
Date:
February 10, 2003
Creator:
Dugan, Edward T. & Jacobs, Alan M.
Item Type:
Refine your search to only
Report
Partner:
UNT Libraries Government Documents Department