Nanograting-based compact VUV spectrometer and beam profiler for in-situ characterization of high-order harmonic generation light sources
Description:
A compact, versatile device for VUV beam characterization is presented. It combines the functionalities of a VUV spectrometer and a VUV beam profiler in one unit and is entirely supported by a standard DN200 CF flange. The spectrometer employs a silicon nitride transmission nanograting in combination with a micro-channel plate based imaging detector. This enables the simultaneous recording of wavelengths ranging from 10 nm to 80 nm with a resolution of 0.25 nm to 0.13 nm. Spatial beam profiles …
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Date:
July 9, 2010
Creator:
Kornilov, Oleg; Wilcox, Russell & Gessner, Oliver
Item Type:
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Partner:
UNT Libraries Government Documents Department