Adaptation of the Siemens Diffractometer for Precision Lattice Parameter Determinations of Single Crystals
Description:
Modifications to the A.A.E.C.'s Siemens Diffractometer are described which enable precision lattice parameter determinations on single crystals. Analysis of the errors and consideration of results suggest that accuracies of about 1--2 parts in 10/sup 5/ are obtained on small beryllium oxide crystals. Details of alignment and measurement procedure are included.
Date:
August 1963
Creator:
Mayer, R. M. & Walker, D. G.
Partner:
UNT Libraries Government Documents Department