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Analytical Microscopy

Description: This brochure presents the capabilities that the Measurements and Characterization Division has in Analytical Microscopy, in which a variety of sophisticated techniques are used to study a material's topographical, crystallographic, structural, chemical, and luminescence properties.
Date: March 16, 2000
Creator: Cook, G.
Item Type: Refine your search to only Pamphlet
open access

Analytical Microscopy

Description: In the Analytical Microscopy group, within the National Center for Photovoltaic's Measurements and Characterization Division, we combine two complementary areas of analytical microscopy--electron microscopy and proximal-probe techniques--and use a variety of state-of-the-art imaging and analytical tools. We also design and build custom instrumentation and develop novel techniques that provide unique capabilities for studying materials and devices. In our work, we collaborate with you to solve m… more
Date: June 1, 2006
Item Type: Refine your search to only Report
open access

Data Transfer and Virtual Lab

Description: This brochure presents the capabilities that the Measurements and Characterization Division has for transferring secure characterization data to clients over the Web, and for collaborating in R and D via the Web over distances (i.e., working as a virtual lab).
Date: March 16, 2000
Creator: Cook, G.
Item Type: Refine your search to only Pamphlet
open access

Device Performance

Description: This brochure presents the capabilities that the Measurements and Characterization Division has in device performance, in which a variety of spectral responsivity and current-versus-voltage techniques are used to measure the spectral dependence of PV cells and module conversion efficiencies, and to measure the output performance of cells and modules under simulated and natural light.
Date: March 16, 2000
Creator: Cook, G.
Item Type: Refine your search to only Pamphlet
open access

Device Performance

Description: In the Device Performance group, within the National Center for Photovoltaic's Measurements and Characterization Division, we measure the performance of PV cells and modules with respect to standard reporting conditions--defined as a reference temperature (25 C), total irradiance (1000 Wm-2), and spectral irradiance distribution (IEC standard 60904-3). Typically, these are ''global'' reference conditions, but we can measure with respect to any reference set. To determine device performance, we … more
Date: June 1, 2006
Item Type: Refine your search to only Report
open access

Electro-Optical Characterization

Description: This brochure presents the capabilities that the Measurements and Characterization Division has in Electro-Optical Characterization, in which a variety of spectroscopy, ellipsometry, and capacitance techniques are used to probe the fundamental electrical and optical properties of solid-state materials.
Date: March 16, 2000
Creator: Cook, G.
Item Type: Refine your search to only Pamphlet
open access

Electro-Optical Characterization

Description: In the Electro-Optical Characterization group, within the National Center for Photovoltaic's Measurements and Characterization Division, we use various electrical and optical experimental techniques to relate photovoltaic device performance to the methods and materials used to produce them. The types of information obtained by these techniques range from small-scale atomic-bonding information to large-scale macroscopic quantities such as optical constants and electron-transport properties. Accu… more
Date: June 1, 2006
Item Type: Refine your search to only Report
open access

Surface Analysis

Description: This brochure presents the capabilities that the Measurements and Characterization Division has in Surface Analysis, in which a variety of spectrometry and spectroscopy techniques are used to determine the chemical, elemental, and molecular composition of material surfaces and interfaces.
Date: March 16, 2000
Creator: Cook, G.
Item Type: Refine your search to only Pamphlet
open access

Surface Analysis

Description: In the Surface Analysis group, within the National Center for Photovoltaic's Measurements and Characterization Division, we use surface analytical techniques help to determine the chemical, elemental, and molecular composition, and electronic structure of material surfaces and interfaces. The properties of the surface and outer few micrometers of a material often control the electrical, chemical, or mechanical properties of that material--hence, this region is of extreme importance. Our techniq… more
Date: June 1, 2006
Item Type: Refine your search to only Report
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