3-D Measurement of Deformation Microstructure of Al(0.2%)Mg Using Submicron Resolution White X-Ray Microbeams
Description:
We have used submicron-resolution white x-ray microbeams on the MHATT-CAT beamline 7-ID at the Advanced Photon Source to develop techniques for three-dimensional investigation of the deformation microstructure in a 20% plane strain compressed Al(0.2%)Mg tri-crystal. Kirkpatrick-Baez mirrors were used to focus white radiation from an undulator to a 0.7 x 0.7 {micro}m{sup 2} beam that was scanned over bi- and tri-crystal regions near the triple-junction of the tri-crystal. Depth resolution along …
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Date:
November 29, 1999
Creator:
Larson, B. C.; tamura, N.; Chung, J.-S.; Ice, G. E.; Budai, J. D.; Tischler, J. Z. et al.
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