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Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry

Description: This article discusses low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry.
Date: June 8, 1998
Creator: McDaniel, Floyd Del. (Floyd Delbert), 1942-; Datar, Sameer A.; Guo, Baonian N.; Renfrow, Steve N.; Anthony, J. M. & Zhao, Z. Y.
Partner: UNT College of Arts and Sciences

Tunneling rate fluctuations induced by nonlinear resonances: A quantitative treatment based on semiclassical arguments

Description: This article discusses tunneling rate fluctuations induced by nonlinear resonances. The authors investigate the tunneling process between two symmetric stable islands of a forced pendulum Hamiltonian in the weak chaos regime.
Date: November 1998
Creator: Bonci, Luca; Farusi, Andrea; Grigolini, Paolo & Roncaglia, Roberto
Partner: UNT College of Arts and Sciences