The Total Quality Approach to Transistor Testing and Device Allocation
Description:
The purpose of this study is to design a transistor conversion system oriented toward quality categories rather than toward devices. Underlying this purpose are two working hypotheses: First, quality categories can be developed by capitalizing on transistor total quality and convertibility; second, a transistor conversion system oriented toward quality categories is superior to existing device-oriented methods.
Date:
May 1971
Creator:
Novak, Jarry Vaclav
Partner:
UNT Libraries