Fuzzy logic scheme for tip-sample distance control for a low cost near field optical microscope

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This article proposes a fuzzy logic control scheme for a control algorithm used with a scanning near field optical microscope.

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9 p.

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Márquez, J. A.; Cortes, R.; Siller Carrillo, Héctor Rafael; Coello, V. & Escamilla, D. December 2013.

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This article proposes a fuzzy logic control scheme for a control algorithm used with a scanning near field optical microscope.

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9 p.

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Abstract: The control of the distance between the surface and the tip-sample of a Scanning Near Field Optical Microscope (SNOM) is essential for a reliable surface mapping. The control algorithm should be able to maintain the system in a constant distance between the tip and the surface. In this system, nanometric adjustments should be made in order to sense topographies at the same scale with an appropriate resolution. These kinds of devices varies its properties through short periods of time, and it is required a control algorithm capable of handle these changes. In this work a fuzzy logic control scheme is proposed in order to manage the changes the device might have through the time, and to counter the effects of the non-linearity as well. Two inputs are used to program the rules inside the fuzzy logic controller, the difference between the reference signal and the sample signal (error), and the speed in which it decreases or increases. A lock-in amplifier is used as data acquisition hardware to sample the high frequency signals used to produce the tuning fork oscillations. Once these variables are read the control algorithm calculate a voltage output to move the piezoelectric device, approaching or removing the tip-probe from the sample analyzed.

Resumen: El control de la distancia entre la superficie y la punta de sensado de un microscopio de escaneo de campo cercano (SNOM por sus siglas en inglés) es esencial para un mapeo superficial confiable. El algoritmo de control tiene que ser capaz de mantener al sistema a una distancia constante entre la punta y la superficie de interés. Se requieren ajustes nanométricos para poder recuperar una topografía con una resolución apropiada, debido a que los cambios en la superficie son en escala nanométrica. Este tipo de dispositivos cambian sus propiedades a lo largo de un periodo de tiempo muy corto, para resolver este problema se necesita un algoritmo de control que sea capaz de manejar estos cambios. En este trabajo se propone un esquema de lógica difusa para de esta manera poder compensar los cambios que el dispositivo pueda presentar a través del tiempo, y para contrarrestar los efectos producidos por la no linealidad que presenta el sistema. Dos entradas fueron usadas para programar las reglas utilizadas en el controlador de lógica difusa, la diferencia entre la señal de referencia y la señal retroalimentada (error), y la velocidad en la cual disminuye o aumenta. Como dispositivo de adquisición de datos se utilizó un amplificador de amarre de fase para leer las señales de alta frecuencia usadas para producir las oscilaciones del diapasón de cuarzo. Una vez que se adquieren estas variables podemos manipularlas por medio del algoritmo de control para calcular una salida de voltaje la cual mueve el dispositivo piezoeléctrico, retrayendo o extendiendo la punta hacia la muestra analizada.

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  • Journal of Applied Research and Technology, 2013. Mexico City, Mexico: Universidad Nacional Autónoma de México

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  • Publication Title: Journal of Applied Research and Technology
  • Volume: 11
  • Issue: 6
  • Page End: 886-894
  • Peer Reviewed: Yes

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  • December 2013

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  • Sept. 29, 2017, 9:53 a.m.

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  • Oct. 7, 2022, 2:51 p.m.

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Márquez, J. A.; Cortes, R.; Siller Carrillo, Héctor Rafael; Coello, V. & Escamilla, D. Fuzzy logic scheme for tip-sample distance control for a low cost near field optical microscope, article, December 2013; Mexico City, Mexico. (https://digital.library.unt.edu/ark:/67531/metadc993959/: accessed September 22, 2023), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT College of Engineering.

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