Point-by-point compositional analysis for atom probe tomography

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This article demonstrates a new alternate approach to data processing for analyses that traditionally employed grid-based counting methods, as demonstrated using an atom-probe analysis of a Ni-based super-alloy.

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7 p.

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Stephenson, Leigh T.; Ceguerra, Anna V.; Li, Tong; Rojhirunsakool, Tanaporn; Nag, Soumya; Banerjee, Rajarshi et al. March 5, 2014.

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This article is part of the collection entitled: UNT Scholarly Works and was provided by UNT College of Engineering to Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 18 times . More information about this article can be viewed below.

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Description

This article demonstrates a new alternate approach to data processing for analyses that traditionally employed grid-based counting methods, as demonstrated using an atom-probe analysis of a Ni-based super-alloy.

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7 p.

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  • MethodsX, 2014. Amsterdam, The Netherlands: Elsevier.

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Publication Information

  • Publication Title: MethodsX
  • Volume: 1
  • Pages: 12-18

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UNT Scholarly Works

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  • March 5, 2014

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  • Dec. 21, 2016, 11:10 p.m.

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Stephenson, Leigh T.; Ceguerra, Anna V.; Li, Tong; Rojhirunsakool, Tanaporn; Nag, Soumya; Banerjee, Rajarshi et al. Point-by-point compositional analysis for atom probe tomography, article, March 5, 2014; Amsterdam, The Netherlands. (digital.library.unt.edu/ark:/67531/metadc944344/: accessed September 25, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT College of Engineering.