Pressure-induced quenching of the charge-density-wave state observed by x-ray diffraction

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We report an x-ray diffraction study on the charge-density-wave (CDW) LaTe{sub 3} and CeTe{sub 3} compounds as a function of pressure. We extract the lattice constants and the CDW modulation wave-vector, and provide direct evidence for a pressure-induced quenching of the CDW phase. We observe subtle differences between the chemical and mechanical compression of the lattice. We account for these with a scenario where the effective dimensionality in these CDW systems is dependent on the type of lattice compression and has a direct impact on the degree of Fermi surface nesting and on the strength of fluctuation effects.

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Sacchetti, A. May 3, 2010.

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We report an x-ray diffraction study on the charge-density-wave (CDW) LaTe{sub 3} and CeTe{sub 3} compounds as a function of pressure. We extract the lattice constants and the CDW modulation wave-vector, and provide direct evidence for a pressure-induced quenching of the CDW phase. We observe subtle differences between the chemical and mechanical compression of the lattice. We account for these with a scenario where the effective dimensionality in these CDW systems is dependent on the type of lattice compression and has a direct impact on the degree of Fermi surface nesting and on the strength of fluctuation effects.

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  • Journal Name: Submitted to Physical Review B

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  • Report No.: SLAC-PUB-14047
  • Grant Number: AC02-76SF00515
  • Office of Scientific & Technical Information Report Number: 978633
  • Archival Resource Key: ark:/67531/metadc935353

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  • May 3, 2010

Added to The UNT Digital Library

  • Nov. 13, 2016, 7:26 p.m.

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  • Feb. 17, 2017, 6:36 p.m.

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Sacchetti, A. Pressure-induced quenching of the charge-density-wave state observed by x-ray diffraction, article, May 3, 2010; United States. (digital.library.unt.edu/ark:/67531/metadc935353/: accessed September 24, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.