Controlled-aperture wave-equation migration Metadata

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  • Main Title Controlled-aperture wave-equation migration


  • Author: Huang, L. (Lian-Jie)
    Creator Type: Personal
  • Author: Fehler, Michael C.
    Creator Type: Personal
  • Author: Sun, H. (Hongchuan)
    Creator Type: Personal
  • Author: Li, Z. (Zhiming)
    Creator Type: Personal


  • Sponsor: United States. Department of Energy.
    Contributor Type: Organization


  • Name: Los Alamos National Laboratory
    Place of Publication: United States


  • Creation: 2003-01-01


  • English


  • Content Description: We present a controlled-aperture wave-equation migration method that no1 only can reduce migration artiracts due to limited recording aperlurcs and determine image weights to balance the efl'ects of limited-aperture illumination, but also can improve thc migration accuracy by reducing the slowness perturbations within thc controlled migration regions. The method consists of two steps: migration aperture scan and controlled-aperture migration. Migration apertures for a sparse distribution of shots arc determined using wave-equation migration, and those for the other shots are obtained by interpolation. During the final controlled-aperture niigration step, we can select a reference slowness in c;ontrollecl regions of the slowness model to reduce slowncss perturbations, and consequently increase the accuracy of wave-equation migration inel hods that makc use of reference slownesses. In addition, the computation in the space domain during wavefield downward continuation is needed to be conducted only within the controlled apertures and therefore, the computational cost of controlled-aperture migration step (without including migration aperture scan) is less than the corresponding uncontrolled-aperture migration. Finally, we can use the efficient split-step Fourier approach for migration-aperture scan, then use other, more accurate though more expensive, wave-equation migration methods to perform thc final migration to produce the most accurate image.
  • Physical Description: 4 p.


  • Keyword: Apertures
  • Keyword: Ineel
  • STI Subject Categories: 97 Mathematical Methods And Computing
  • Keyword: Illuminance
  • Keyword: Distribution
  • Keyword: Interpolation
  • Keyword: Accuracy


  • Conference: Submitted to: SEG 2003 International Exposition and 73rd Annual Meeting


  • Name: Office of Scientific & Technical Information Technical Reports
    Code: OSTI


  • Name: UNT Libraries Government Documents Department
    Code: UNTGD

Resource Type

  • Article


  • Text


  • Report No.: LA-UR-03-2539
  • Grant Number: none
  • Office of Scientific & Technical Information Report Number: 976605
  • Archival Resource Key: ark:/67531/metadc935298