Optical Reflectance Measurements for Commonly Used Reflectors

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When simulating light collection in scintillators, modeling the angular distribution of optical light reflectance from surfaces is very important. Since light reflectance is poorly understood, either purely specular or purely diffuse reflectance is generally assumed. In this paper we measure the optical reflectance distribution for eleven commonly used reflectors. A 440 nm, output power stabilized, un-polarized laser is shone onto a reflector at a fixed angle of incidence. The reflected light's angular distribution is measured by an array of silicon photodiodes. The photodiodes are movable to cover 2 pi of solid angle. The light-induced current is, through a multiplexer, read ... continued below

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Janecek, Petr Martin & Moses, William June 11, 2008.

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When simulating light collection in scintillators, modeling the angular distribution of optical light reflectance from surfaces is very important. Since light reflectance is poorly understood, either purely specular or purely diffuse reflectance is generally assumed. In this paper we measure the optical reflectance distribution for eleven commonly used reflectors. A 440 nm, output power stabilized, un-polarized laser is shone onto a reflector at a fixed angle of incidence. The reflected light's angular distribution is measured by an array of silicon photodiodes. The photodiodes are movable to cover 2 pi of solid angle. The light-induced current is, through a multiplexer, read out with a digital multimeter. A LabVIEW program controls the motion of the laser and the photodiode array, the multiplexer, and the data collection. The laser can be positioned at any angle with a position accuracy of 10 arc minutes. Each photodiode subtends 6.3o, and the photodiode array can be positioned at any angle with up to 10 arc minute angular resolution. The dynamic range for the current measurements is 105:1. The measured light reflectance distribution was measured to be specular for several ESR films as well as for aluminum foil, mostly diffuse for polytetrafluoroethylene (PTFE) tape and titanium dioxide paint, and neither specular nor diffuse for Lumirror(R), Melinex(R) and Tyvek(R). Instead, a more complicated light distribution was measured for these three materials.

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  • Journal Name: IEEE Transactions on Nuclear Science; Journal Volume: 55; Journal Issue: 4, part 2; Related Information: Journal Publication Date: August 2008

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  • Report No.: LBNL-1791E
  • Grant Number: DE-AC02-05CH11231
  • Office of Scientific & Technical Information Report Number: 957053
  • Archival Resource Key: ark:/67531/metadc934420

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • June 11, 2008

Added to The UNT Digital Library

  • Nov. 13, 2016, 7:26 p.m.

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  • Nov. 18, 2016, 3:04 p.m.

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Janecek, Petr Martin & Moses, William. Optical Reflectance Measurements for Commonly Used Reflectors, article, June 11, 2008; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc934420/: accessed August 18, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.