Interface and magnetic characterization of ultrathin EuO films with XMCD

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We present work done on EuO films with thicknesses varying from 10 to 60 A grown as a stepped wedge on Si/Cr(20 {angstrom})/Cu(90 {angstrom}) and capped with Y(20 {angstrom})/Al(80 {angstrom}). The films were characterized by x-ray absorption spectroscopy (XAS) and x-ray magnetic circular dichroism (XMCD) at the europium M{sub 5} and copper L{sub 3} edges. The films high quality and consistent magnetic properties were confirmed by SQUID magnetometry, which revealed a constant saturation moment independent of film thickness. XAS at the Cu L{sub 3} edge showed that the bottom Cu electrode is metallic (oxidation free). We report an XMCD intensity ... continued below

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Negusse, E.; Dvorak, J.; Holroyd, J. S.; Liberati, M.; Santos, T. S.; Moodera, J. S. et al. September 20, 2008.

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We present work done on EuO films with thicknesses varying from 10 to 60 A grown as a stepped wedge on Si/Cr(20 {angstrom})/Cu(90 {angstrom}) and capped with Y(20 {angstrom})/Al(80 {angstrom}). The films were characterized by x-ray absorption spectroscopy (XAS) and x-ray magnetic circular dichroism (XMCD) at the europium M{sub 5} and copper L{sub 3} edges. The films high quality and consistent magnetic properties were confirmed by SQUID magnetometry, which revealed a constant saturation moment independent of film thickness. XAS at the Cu L{sub 3} edge showed that the bottom Cu electrode is metallic (oxidation free). We report an XMCD intensity of 52% ({+-}4.3), in close agreement with theoretical calculations.

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  • Journal Name: Journal of Applied Physics; Journal Volume: 105

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  • Report No.: LBNL-1741E
  • Grant Number: DE-AC02-05CH11231
  • Office of Scientific & Technical Information Report Number: 951770
  • Archival Resource Key: ark:/67531/metadc933979

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  • September 20, 2008

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  • Nov. 13, 2016, 7:26 p.m.

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  • Jan. 4, 2017, 3:34 p.m.

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Negusse, E.; Dvorak, J.; Holroyd, J. S.; Liberati, M.; Santos, T. S.; Moodera, J. S. et al. Interface and magnetic characterization of ultrathin EuO films with XMCD, article, September 20, 2008; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc933979/: accessed December 14, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.