Point Defect Characterization in CdZnTe

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Measurements of the defect levels and performance testing of CdZnTe detectors were performed by means of Current Deep Level Transient Spectroscopy (I-DLTS), Transient Charge Technique (TCT), Current versus Voltage measurements (I-V), and gamma-ray spectroscopy. CdZnTe crystals were acquired from different commercial vendors and characterized for their point defects. I-DLTS studies included measurements of defect parameters such as energy levels in the band gap, carrier capture cross sections, and defect densities. The induced current due to laser-generated carriers was measured using TCT. The data were used to determine the transport properties of the detectors under study. A good correlation was found ... continued below

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Gul, R.; Li, Z.; Bolotnikov, A.; Keeter, K.; Rodriguez, R. & James, R. March 24, 2009.

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Measurements of the defect levels and performance testing of CdZnTe detectors were performed by means of Current Deep Level Transient Spectroscopy (I-DLTS), Transient Charge Technique (TCT), Current versus Voltage measurements (I-V), and gamma-ray spectroscopy. CdZnTe crystals were acquired from different commercial vendors and characterized for their point defects. I-DLTS studies included measurements of defect parameters such as energy levels in the band gap, carrier capture cross sections, and defect densities. The induced current due to laser-generated carriers was measured using TCT. The data were used to determine the transport properties of the detectors under study. A good correlation was found between the point defects in the detectors and their performance.

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  • IEEE Dresden 2008; Dresden, Germany; 20081019 through 20081025

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  • Report No.: BNL--82075-2009-CP
  • Grant Number: DE-AC02-98CH10886
  • Office of Scientific & Technical Information Report Number: 950451
  • Archival Resource Key: ark:/67531/metadc933000

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  • March 24, 2009

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  • Nov. 13, 2016, 7:26 p.m.

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  • Sept. 25, 2017, 3:17 p.m.

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Gul, R.; Li, Z.; Bolotnikov, A.; Keeter, K.; Rodriguez, R. & James, R. Point Defect Characterization in CdZnTe, article, March 24, 2009; United States. (digital.library.unt.edu/ark:/67531/metadc933000/: accessed November 21, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.