Measurement Of Transverse Jc Profiles Of Coated Conductors Using A Magnetic Knife Of Permanent Magnets

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The transverse J{sub c} distribution in YBCO coated conductors was measured nondestructively with high resolution using a 'magnetic knife' made of permanent magnets. The method utilizes the strong depression of J{sub c} in applied magnetic fields. A narrow region of low (including zero) magnetic field, in a surrounding higher field, is moved transversely across the sample in order to reveal the critical-current density distribution. The net resolution of this device is approximately 65 {mu}m, and the J{sub c} resolution is better than 0.5%. A Fourier series inversion process was used to determine the transverse J{sub c} distribution in the sample. ... continued below

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Hanisch, J; Mueller, F M; Ashworth, S P; Coulter, J Y & Matias, Vlad January 1, 2008.

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The transverse J{sub c} distribution in YBCO coated conductors was measured nondestructively with high resolution using a 'magnetic knife' made of permanent magnets. The method utilizes the strong depression of J{sub c} in applied magnetic fields. A narrow region of low (including zero) magnetic field, in a surrounding higher field, is moved transversely across the sample in order to reveal the critical-current density distribution. The net resolution of this device is approximately 65 {mu}m, and the J{sub c} resolution is better than 0.5%. A Fourier series inversion process was used to determine the transverse J{sub c} distribution in the sample. The J{sub c} profile was correlated with other sample properties of coated conductors prepared by pulsed laser deposition. Because of its straight-forward and inexpensive design, this J{sub c} imaging technique can be a powerful tool for quality control in coated-conductor production.

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  • Journal Name: Applied Physics Letters

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  • Report No.: LA-UR-08-04381
  • Report No.: LA-UR-08-4381
  • Grant Number: AC52-06NA25396
  • Office of Scientific & Technical Information Report Number: 956592
  • Archival Resource Key: ark:/67531/metadc931967

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  • January 1, 2008

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  • Nov. 13, 2016, 7:26 p.m.

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  • Dec. 12, 2016, 5:55 p.m.

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Hanisch, J; Mueller, F M; Ashworth, S P; Coulter, J Y & Matias, Vlad. Measurement Of Transverse Jc Profiles Of Coated Conductors Using A Magnetic Knife Of Permanent Magnets, article, January 1, 2008; [New Mexico]. (digital.library.unt.edu/ark:/67531/metadc931967/: accessed April 20, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.