Innovative Characterization of Amorphous and Thin-Film Silicon for Improved Module Performance: 28 April 2005 - 15 September 2008

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This report focuses on (1) characterizing nc-Si:H from United Solar; (2) studying Si,Ge:H alloys deposited by HWCVD; and (3) characterizing CIGS films and relating to cell performance parameters.

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76 pp.

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Cohen, J. D. December 1, 2009.

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Description

This report focuses on (1) characterizing nc-Si:H from United Solar; (2) studying Si,Ge:H alloys deposited by HWCVD; and (3) characterizing CIGS films and relating to cell performance parameters.

Physical Description

76 pp.

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  • Related Information: Work performed by University of Oregon, Eugene, Oregon

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  • Report No.: NREL/SR-520-47195
  • Grant Number: AC36-99-GO10337
  • DOI: 10.2172/969715 | External Link
  • Office of Scientific & Technical Information Report Number: 969715
  • Archival Resource Key: ark:/67531/metadc931870

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Office of Scientific & Technical Information Technical Reports

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  • December 1, 2009

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  • Nov. 13, 2016, 7:26 p.m.

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  • Nov. 29, 2016, 3:51 p.m.

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Cohen, J. D. Innovative Characterization of Amorphous and Thin-Film Silicon for Improved Module Performance: 28 April 2005 - 15 September 2008, report, December 1, 2009; Golden, Colorado. (digital.library.unt.edu/ark:/67531/metadc931870/: accessed February 17, 2019), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.