Statistical Fault Detection for Parallel Applications with AutomaDeD

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Today's largest systems have over 100,000 cores, with million-core systems expected over the next few years. The large component count means that these systems fail frequently and often in very complex ways, making them difficult to use and maintain. While prior work on fault detection and diagnosis has focused on faults that significantly reduce system functionality, the wide variety of failure modes in modern systems makes them likely to fail in complex ways that impair system performance but are difficult to detect and diagnose. This paper presents AutomaDeD, a statistical tool that models the timing behavior of each application task ... continued below

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Bronevetsky, G; Laguna, I; Bagchi, S; de Supinski, B R; Ahn, D & Schulz, M March 23, 2010.

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Today's largest systems have over 100,000 cores, with million-core systems expected over the next few years. The large component count means that these systems fail frequently and often in very complex ways, making them difficult to use and maintain. While prior work on fault detection and diagnosis has focused on faults that significantly reduce system functionality, the wide variety of failure modes in modern systems makes them likely to fail in complex ways that impair system performance but are difficult to detect and diagnose. This paper presents AutomaDeD, a statistical tool that models the timing behavior of each application task and tracks its behavior to identify any abnormalities. If any are observed, AutomaDeD can immediately detect them and report to the system administrator the task where the problem began. This identification of the fault's initial manifestation can provide administrators with valuable insight into the fault's root causes, making it significantly easier and cheaper for them to understand and repair it. Our experimental evaluation shows that AutomaDeD detects a wide range of faults immediately after they occur 80% of the time, with a low false-positive rate. Further, it identifies weaknesses of the current approach that motivate future research.

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  • Presented at: IEEE Workshop on Silicon Errors in Logic - System Effects, Stanford, CA, United States, Mar 23 - Mar 24, 2010

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  • Report No.: LLNL-CONF-426254
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 974392
  • Archival Resource Key: ark:/67531/metadc930889

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  • March 23, 2010

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  • Nov. 13, 2016, 7:26 p.m.

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  • Dec. 9, 2016, 8:44 p.m.

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Bronevetsky, G; Laguna, I; Bagchi, S; de Supinski, B R; Ahn, D & Schulz, M. Statistical Fault Detection for Parallel Applications with AutomaDeD, article, March 23, 2010; Livermore, California. (digital.library.unt.edu/ark:/67531/metadc930889/: accessed September 22, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.