High Resolution/High Fidelity Seismic Imaging and Parameter Estimation for Geological Structure and Material Characterization

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Our proposed work on high resolution/high fidelity seismic imaging focused on three general areas: (1) development of new, more efficient, wave-equation-based propagators and imaging conditions, (2) developments towards amplitude-preserving imaging in the local angle domain, in particular, imaging methods that allow us to estimate the reflection as a function of angle at a layer boundary, and (3) studies of wave inversion for local parameter estimation. In this report we summarize the results and progress we made during the project period. The report is divided into three parts, totaling 10 chapters. The first part is on resolution analysis and its relation ... continued below

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Wu, Ru-Shan & Xie, Xiao-Bi June 8, 2008.

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Description

Our proposed work on high resolution/high fidelity seismic imaging focused on three general areas: (1) development of new, more efficient, wave-equation-based propagators and imaging conditions, (2) developments towards amplitude-preserving imaging in the local angle domain, in particular, imaging methods that allow us to estimate the reflection as a function of angle at a layer boundary, and (3) studies of wave inversion for local parameter estimation. In this report we summarize the results and progress we made during the project period. The report is divided into three parts, totaling 10 chapters. The first part is on resolution analysis and its relation to directional illumination analysis. The second part, which is composed of 6 chapters, is on the main theme of our work, the true-reflection imaging. True-reflection imaging is an advanced imaging technology which aims at keeping the image amplitude proportional to the reflection strength of the local reflectors or to obtain the reflection coefficient as function of reflection-angle. There are many factors which may influence the image amplitude, such as geometrical spreading, transmission loss, path absorption, acquisition aperture effect, etc. However, we can group these into two categories: one is the propagator effect (geometric spreading, path losses); the other is the acquisition-aperture effect. We have made significant progress in both categories. We studied the effects of different terms in the true-amplitude one-way propagators, especially the terms including lateral velocity variation of the medium. We also demonstrate the improvements by optimizing the expansion coefficients in different terms. Our research also includes directional illumination analysis for both the one-way propagators and full-wave propagators. We developed the fast acquisition-aperture correction method in the local angle-domain, which is an important element in the true-reflection imaging. Other developments include the super-wide angle one-way propagator and special full-wave reverse-time migration method. Finally, we studied the theoretical basis of true-reflection imaging and bridges imaging and inversion with the theory of diffraction tomography.

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  • Report No.: NONE
  • Grant Number: FG02-04ER15530
  • DOI: 10.2172/950492 | External Link
  • Office of Scientific & Technical Information Report Number: 950492
  • Archival Resource Key: ark:/67531/metadc929885

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  • June 8, 2008

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  • Nov. 13, 2016, 7:26 p.m.

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Wu, Ru-Shan & Xie, Xiao-Bi. High Resolution/High Fidelity Seismic Imaging and Parameter Estimation for Geological Structure and Material Characterization, report, June 8, 2008; United States. (digital.library.unt.edu/ark:/67531/metadc929885/: accessed November 16, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.