TCT and test beam results of irradiated magnetic Czochralski silicon (MCz-Si) detectors

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Pad and strip detectors processed on high resistivity n-type magnetic Czochralski silicon (MCz-Si) were irradiated to several different fluences with protons. The pad detectors were characterized with the transient current technique (TCT) and the full-size strip detectors with a reference beam telescope and a 225 GeV muon beam. The TCT measurements indicate a double junction structure and space charge sign inversion in MCz-Si detectors after 6x1014 1 MeV neq/cm2 fluence. In the beam test a signal-to-noise (S/N) ratio of 50 was measured for a non-irradiated MCz-Si sensor, and a S/N ratio of 20 for the sensors irradiated to the fluences ... continued below

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4 pages

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Luukka, P.; Harkonen, J.; Maenpaa, T.; Phys., /Helsinki Inst. of; Betchart, B.; U., /Rochester et al. January 1, 2009.

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Pad and strip detectors processed on high resistivity n-type magnetic Czochralski silicon (MCz-Si) were irradiated to several different fluences with protons. The pad detectors were characterized with the transient current technique (TCT) and the full-size strip detectors with a reference beam telescope and a 225 GeV muon beam. The TCT measurements indicate a double junction structure and space charge sign inversion in MCz-Si detectors after 6x1014 1 MeV neq/cm2 fluence. In the beam test a signal-to-noise (S/N) ratio of 50 was measured for a non-irradiated MCz-Si sensor, and a S/N ratio of 20 for the sensors irradiated to the fluences of 1x1014 1 and 5x1014 1 MeV neq/cm2.

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4 pages

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  • Journal Name: Nucl.Instrum.Meth.A604:254-257,2009

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  • Report No.: FERMILAB-CONF-09-677-E
  • Grant Number: AC02-07CH11359
  • DOI: 10.1016/j.nima.2009.01.071 | External Link
  • Office of Scientific & Technical Information Report Number: 976881
  • Archival Resource Key: ark:/67531/metadc929109

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  • January 1, 2009

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  • Nov. 13, 2016, 7:26 p.m.

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  • Dec. 7, 2016, 10:57 p.m.

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Luukka, P.; Harkonen, J.; Maenpaa, T.; Phys., /Helsinki Inst. of; Betchart, B.; U., /Rochester et al. TCT and test beam results of irradiated magnetic Czochralski silicon (MCz-Si) detectors, article, January 1, 2009; Batavia, Illinois. (digital.library.unt.edu/ark:/67531/metadc929109/: accessed November 15, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.