Particle-In-Cell/Monte Carlo Simulation of Ion Back BomBardment in a High Average Current RF Photo-Gun

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In this paper, we report on study of ion back bombardment in a high average current radio-frequency (RF) photo-gun using a particle-in-cell/Monte Carlo simulation method. Using this method, we systematically studied effects of gas pressure, RF frequency, RF initial phase, electric field profile, magnetic field, laser repetition rate, different ion species on ion particle line density distribution, kinetic energy spectrum, and ion power line density distribution back bombardment onto the photocathode. Those simulation results suggested that effects of ion back bombardment could increase linearly with the background gas pressure and laser repetition rate. The RF frequency has significantly affected the ... continued below

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Qiang, J. October 17, 2009.

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In this paper, we report on study of ion back bombardment in a high average current radio-frequency (RF) photo-gun using a particle-in-cell/Monte Carlo simulation method. Using this method, we systematically studied effects of gas pressure, RF frequency, RF initial phase, electric field profile, magnetic field, laser repetition rate, different ion species on ion particle line density distribution, kinetic energy spectrum, and ion power line density distribution back bombardment onto the photocathode. Those simulation results suggested that effects of ion back bombardment could increase linearly with the background gas pressure and laser repetition rate. The RF frequency has significantly affected the ion motion inside the gun so that the ion power deposition on the photocathode in an RF gun can be several orders of magnitude lower than that in a DC gun. The ion back bombardment can be minimized by appropriately choosing the electric field profile and the initial phase.

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  • Journal Name: Nuclear Instrument Method Research A

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  • Report No.: LBNL-2833E
  • Grant Number: DE-AC02-05CH11231
  • Office of Scientific & Technical Information Report Number: 979018
  • Archival Resource Key: ark:/67531/metadc928446

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Office of Scientific & Technical Information Technical Reports

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  • October 17, 2009

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  • Nov. 13, 2016, 7:26 p.m.

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  • Jan. 4, 2017, 3:08 p.m.

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Qiang, J. Particle-In-Cell/Monte Carlo Simulation of Ion Back BomBardment in a High Average Current RF Photo-Gun, article, October 17, 2009; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc928446/: accessed July 21, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.