Advanced characterization of twins using automated electron backscatter diffraction

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This paper describes results obtained using an automated, crystallographically-based technique for twin identification. The technique is based on the automated collection of spatially specific orientation measurements by electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM). The key features of the analysis are identification of potential twin boundaries by their misorientation character, identification of the distinct boundary planes among the symmetrically equivalent candidates, and validation of these boundaries through comparison with the boundary and twin plane traces in the sample cross section. Results on the application of this technique to deformation twins in zirconium are analyzed for the effect ... continued below

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8 p.

Creation Information

Wright, S. I. (Stuart I.); Bingert, J. F. (John F.); Mason, T. A. (Thomas A.) & Larson, R. J. (Ryan J.) January 1, 2002.

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Description

This paper describes results obtained using an automated, crystallographically-based technique for twin identification. The technique is based on the automated collection of spatially specific orientation measurements by electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM). The key features of the analysis are identification of potential twin boundaries by their misorientation character, identification of the distinct boundary planes among the symmetrically equivalent candidates, and validation of these boundaries through comparison with the boundary and twin plane traces in the sample cross section. Results on the application of this technique to deformation twins in zirconium are analyzed for the effect of twin type and amount and sense of uniaxial deformation. The accumulation of strain tends to increase the misorientation deviation at least to the degree of the trace deviation compared with recrystallization twins in nickel. In addition to the results on characterizing the twin character, results on extending the twin analysis to automated identification of parent and daughter material for structures exhibiting twin deformation are reported as well.

Physical Description

8 p.

Source

  • Submitted to: Materials Science Forum, Proceedings of ICOTOM 13, Seoul, South Korea, August 26-30, 2002

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  • Report No.: LA-UR-02-2012
  • Grant Number: none
  • Office of Scientific & Technical Information Report Number: 976147
  • Archival Resource Key: ark:/67531/metadc928035

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • January 1, 2002

Added to The UNT Digital Library

  • Nov. 13, 2016, 7:26 p.m.

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  • Dec. 9, 2016, 10:34 p.m.

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Wright, S. I. (Stuart I.); Bingert, J. F. (John F.); Mason, T. A. (Thomas A.) & Larson, R. J. (Ryan J.). Advanced characterization of twins using automated electron backscatter diffraction, article, January 1, 2002; United States. (digital.library.unt.edu/ark:/67531/metadc928035/: accessed April 20, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.