Next Generation Fast RF Interlock Module and ATCA Adapter for ILC High Availability RF Test Station Demonstration

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Description

High availability interlocks and controls are required for the ILC (International Linear Collider) L-Band high power RF stations. A new F3 (Fast Fault Finder) VME module has been developed to process both fast and slow interlocks using FPGA logic to detect the interlock trip excursions. This combination eliminates the need for separate PLC (Programmable Logic Controller) control of slow interlocks. Modules are chained together to accommodate as many inputs as needed. In the next phase of development the F3's will be ported to the new industry standard ATCA (Advanced Telecom Computing Architecture) crate (shelf) via a specially designed VME adapter ... continued below

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Larsen, R. October 17, 2009.

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High availability interlocks and controls are required for the ILC (International Linear Collider) L-Band high power RF stations. A new F3 (Fast Fault Finder) VME module has been developed to process both fast and slow interlocks using FPGA logic to detect the interlock trip excursions. This combination eliminates the need for separate PLC (Programmable Logic Controller) control of slow interlocks. Modules are chained together to accommodate as many inputs as needed. In the next phase of development the F3's will be ported to the new industry standard ATCA (Advanced Telecom Computing Architecture) crate (shelf) via a specially designed VME adapter module with IPMI (Intelligent Platform Management Interface). The goal is to demonstrate auto-failover and hot-swap for future partially redundant systems.

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  • Presented atPAC 2009, Vancouver Canada, 5/4/2009-5/8/2009

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  • Report No.: SLAC-PUB-13595
  • Grant Number: AC02-76SF00515
  • Office of Scientific & Technical Information Report Number: 968537
  • Archival Resource Key: ark:/67531/metadc927794

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  • October 17, 2009

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  • Nov. 13, 2016, 7:26 p.m.

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  • Dec. 15, 2016, 3:39 p.m.

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Larsen, R. Next Generation Fast RF Interlock Module and ATCA Adapter for ILC High Availability RF Test Station Demonstration, article, October 17, 2009; United States. (digital.library.unt.edu/ark:/67531/metadc927794/: accessed September 24, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.