Accelerated Stress Testing and Diagnostic Analysis of Degradation in CdTe Solar Cells

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Description

The primary goal of this study was to ascertain the presence and types of mechanisms affecting CdS/CdTe device stability in the temperature range of 60 to 120 ..deg..C. It should be noted that the results presented were specific to cells made using the specific growth conditions described.

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13 p.

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Albin, D. S. November 1, 2008.

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Description

The primary goal of this study was to ascertain the presence and types of mechanisms affecting CdS/CdTe device stability in the temperature range of 60 to 120 ..deg..C. It should be noted that the results presented were specific to cells made using the specific growth conditions described.

Physical Description

13 p.

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  • Presented at the 2008 SPIE Optics+Photonics Meeting: Reliability of Photovoltaic Cells, Modules, Components, and Systems; 10-14 August 2008; San Diego, California

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  • Report No.: NREL/CP-520-42811
  • Grant Number: AC36-99-GO10337
  • Office of Scientific & Technical Information Report Number: 941476
  • Archival Resource Key: ark:/67531/metadc902453

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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Creation Date

  • November 1, 2008

Added to The UNT Digital Library

  • Sept. 27, 2016, 1:39 a.m.

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  • April 3, 2017, 7:48 p.m.

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Albin, D. S. Accelerated Stress Testing and Diagnostic Analysis of Degradation in CdTe Solar Cells, article, November 1, 2008; Golden, Colorado. (digital.library.unt.edu/ark:/67531/metadc902453/: accessed September 22, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.