Resonant Auger Effect at High X-Ray Intensity

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The resonant Auger effect of atomic neon exposed to high-intensity x-ray radiation in resonance with the 1s {yields} 3p transition is discussed. High intensity here means that the x-ray peak intensity is sufficient ({approx} 10{sup 18} W/cm{sup 2}) to induce Rabi oscillations between the neon ground state and the 1s{sup -1}3p ({sup 1}P) state within the relaxation lifetime of the inner-shell vacancy. For the numerical analysis presented, an effective two-level model, including a description of the resonant Auger decay process, is employed. Both coherent and chaotic x-ray pulses are treated. The latter are used to simulate radiation from x-ray free-electron ... continued below

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Rohringer, N & Santra, R March 27, 2008.

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The resonant Auger effect of atomic neon exposed to high-intensity x-ray radiation in resonance with the 1s {yields} 3p transition is discussed. High intensity here means that the x-ray peak intensity is sufficient ({approx} 10{sup 18} W/cm{sup 2}) to induce Rabi oscillations between the neon ground state and the 1s{sup -1}3p ({sup 1}P) state within the relaxation lifetime of the inner-shell vacancy. For the numerical analysis presented, an effective two-level model, including a description of the resonant Auger decay process, is employed. Both coherent and chaotic x-ray pulses are treated. The latter are used to simulate radiation from x-ray free-electron lasers based on the principle of self-amplified spontaneous emission. Observing x-ray-driven atomic population dynamics in the time domain is challenging for chaotic pulse ensembles. A more practical option for experiments using x-ray free-electron lasers is to measure the line profiles in the kinetic energy distribution of the resonant Auger electron. This provides information on both atomic population dynamics and x-ray pulse properties.

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PDF-file: 18 pages; size: 0.2 Mbytes

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  • Journal Name: Physical Review A, vol. 77, N/A, May 15, 2008, pp. 053404; Journal Volume: 77

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  • Report No.: LLNL-JRNL-403123
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 945147
  • Archival Resource Key: ark:/67531/metadc902438

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  • March 27, 2008

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  • Sept. 27, 2016, 1:39 a.m.

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  • Dec. 1, 2016, 4:30 p.m.

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Rohringer, N & Santra, R. Resonant Auger Effect at High X-Ray Intensity, article, March 27, 2008; Livermore, California. (digital.library.unt.edu/ark:/67531/metadc902438/: accessed June 20, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.