Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy Metadata

Metadata describes a digital item, providing (if known) such information as creator, publisher, contents, size, relationship to other resources, and more. Metadata may also contain "preservation" components that help us to maintain the integrity of digital files over time.

Available Formats

Dublin Core: XML Dublin Core: JSON Dublin Core: Text Dublin Core: RDF/XML UNTL: XML Access METS: XML

Title

  • Main Title Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy

Creator

  • Author: Schwarz, Udo
    Creator Type: Personal
  • Author: Albers, Boris J.
    Creator Type: Personal
  • Author: Liebmann, Marcus
    Creator Type: Personal
  • Author: Schwendemann, Todd C.
    Creator Type: Personal
  • Author: Baykara, Mehmet Z.
    Creator Type: Personal
  • Author: Heyde, Markus
    Creator Type: Personal
  • Author: Salmeron, Miquel
    Creator Type: Personal
  • Author: Altman, Eric I.
    Creator Type: Personal
  • Author: Schwarz, Udo D.
    Creator Type: Personal

Contributor

  • Sponsor: Lawrence Berkeley Laboratory. Materials and Molecular Research Division.
    Contributor Type: Organization
    Contributor Info: Materials Sciences Division

Publisher

  • Name: Lawrence Berkeley National Laboratory
    Place of Publication: Berkeley, California
    Additional Info: Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (United States)

Date

  • Creation: 2008-02-27

Language

  • English

Description

  • Content Description: The authors present the design and first results of a low-temperature, ultrahigh vacuum scanning probe microscope enabling atomic resolution imaging in both scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) modes. A tuning-fork-based sensor provides flexibility in selecting probe tip materials, which can be either metallic or nonmetallic. When choosing a conducting tip and sample, simultaneous STM/NC-AFM data acquisition is possible. Noticeable characteristics that distinguish this setup from similar systems providing simultaneous STM/NC-AFM capabilities are its combination of relative compactness (on-top bath cryostat needs no pit), in situ exchange of tip and sample at low temperatures, short turnaround times, modest helium consumption, and unrestricted access from dedicated flanges. The latter permits not only the optical surveillance of the tip during approach but also the direct deposition of molecules or atoms on either tip or sample while they remain cold. Atomic corrugations as low as 1 pm could successfully be resolved. In addition, lateral drifts rates of below 15 pm/h allow long-term data acquisition series and the recording of site-specific spectroscopy maps. Results obtained on Cu(111) and graphite illustrate the microscope's performance.

Subject

  • Keyword: Spectroscopy Spms Uhv
  • Keyword: Scanning Tunneling Microscopy
  • Keyword: Atoms
  • Keyword: Graphite
  • Keyword: Data Acquisition
  • STI Subject Categories: 36
  • Keyword: Cryostats
  • Keyword: Resolution
  • Keyword: Probes
  • Keyword: Atomic Force Microscopy
  • Keyword: Deposition
  • Keyword: Design
  • Keyword: Microscopes
  • Keyword: Flanges
  • Keyword: Spms Uhv
  • Keyword: Helium
  • Keyword: Performance
  • Keyword: Flexibility

Source

  • Journal Name: Review of Scientific Instruments; Journal Volume: 79

Collection

  • Name: Office of Scientific & Technical Information Technical Reports
    Code: OSTI

Institution

  • Name: UNT Libraries Government Documents Department
    Code: UNTGD

Resource Type

  • Article

Format

  • Text

Identifier

  • Report No.: LBNL-215E
  • Grant Number: DE-AC02-05CH11231
  • DOI: 10.1063/1.2801346
  • Office of Scientific & Technical Information Report Number: 927866
  • Archival Resource Key: ark:/67531/metadc901732
Back to Top of Screen