Temperature dependence of the interface moments in Co2MnSi thin films

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X-ray magnetic circular dichroism (XMCD) is utilized to explore the temperature dependence of the interface moments in Co{sub 2}MnSi (CMS) thin films capped with aluminium. By increasing the thickness of the capping layer we demonstrate enhanced interface sensitivity of the measurements and the existence of a thin Mn oxide layer at the CMS/Al interface even when a thick capping layer is used. We show that for well ordered L2{sub 1} CMS films there is no significant variation in either the Co or Mn interface moments as a function of temperature. However, a dramatic reduction in the interface moments at low ... continued below

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Arenholz, Elke; Telling, N.; Keatley, P.; Shelford, L.; Arenholz, E.; van der Laan, G. et al. March 15, 2008.

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X-ray magnetic circular dichroism (XMCD) is utilized to explore the temperature dependence of the interface moments in Co{sub 2}MnSi (CMS) thin films capped with aluminium. By increasing the thickness of the capping layer we demonstrate enhanced interface sensitivity of the measurements and the existence of a thin Mn oxide layer at the CMS/Al interface even when a thick capping layer is used. We show that for well ordered L2{sub 1} CMS films there is no significant variation in either the Co or Mn interface moments as a function of temperature. However, a dramatic reduction in the interface moments at low temperature is observed in a disordered CMS film that is likely to be caused by increased Mn-Mn antiferromagnetic coupling. It is suggested that for ordered L2{sub 1} CMS films the temperature dependence of the tunneling magnetoresistance is not related to changes in the interface moments. However, the existence of residual Mn oxide at the CMS/barrier interface could be a contributing factor.

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  • Journal Name: APPLIED PHYSICS LETTERS; Journal Volume: 92

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  • Report No.: LBNL-257E
  • Grant Number: DE-AC02-05CH11231
  • Office of Scientific & Technical Information Report Number: 928964
  • Archival Resource Key: ark:/67531/metadc901638

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  • March 15, 2008

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  • Sept. 27, 2016, 1:39 a.m.

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  • Jan. 4, 2017, 3:55 p.m.

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Arenholz, Elke; Telling, N.; Keatley, P.; Shelford, L.; Arenholz, E.; van der Laan, G. et al. Temperature dependence of the interface moments in Co2MnSi thin films, article, March 15, 2008; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc901638/: accessed September 22, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.