Soft X-Ray Magnetic Imaging of Focused Ion Beam Lithographically Patterned Fe Thin Films

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We illustrate the potential of modifying the magnetic behavior and structural properties of ferromagnetic thin films using focused ion beam 'direct-write' lithography. Patterns inspired by the split-ring resonators often used as components in meta-materials were defined upon 15 nm Fe films using a 30 keV Ga{sup +} focused ion beam at a dose of 2 x 10{sup 16} ions cm{sup -2}. Structural, chemical and magnetic changes to the Fe were studied using transmission soft X-ray microscopy at the ALS, Berkeley CA. X-ray absorption spectra showed a 23% reduction in the thickness of the film in the Ga irradiated areas, but ... continued below

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Cook, Paul J.; Shen, Tichan H.; Grundy, PhilJ.; Im, Mi Young; Fischer, Peter; Morton, Simon A. et al. November 9, 2008.

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We illustrate the potential of modifying the magnetic behavior and structural properties of ferromagnetic thin films using focused ion beam 'direct-write' lithography. Patterns inspired by the split-ring resonators often used as components in meta-materials were defined upon 15 nm Fe films using a 30 keV Ga{sup +} focused ion beam at a dose of 2 x 10{sup 16} ions cm{sup -2}. Structural, chemical and magnetic changes to the Fe were studied using transmission soft X-ray microscopy at the ALS, Berkeley CA. X-ray absorption spectra showed a 23% reduction in the thickness of the film in the Ga irradiated areas, but no change to the chemical environment of Fe was evident. X-ray images of the magnetic reversal process show domain wall pinning around the implanted areas, resulting in an overall increase in the coercivity of the film. Transmission electron microscopy showed significant grain growth in the implanted regions.

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  • Journal Name: Applied Physics Letters

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  • Report No.: LBNL-1219E
  • Grant Number: DE-AC02-05CH11231
  • Office of Scientific & Technical Information Report Number: 943519
  • Archival Resource Key: ark:/67531/metadc900144

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  • November 9, 2008

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  • Sept. 27, 2016, 1:39 a.m.

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  • Oct. 2, 2017, 5:37 p.m.

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Cook, Paul J.; Shen, Tichan H.; Grundy, PhilJ.; Im, Mi Young; Fischer, Peter; Morton, Simon A. et al. Soft X-Ray Magnetic Imaging of Focused Ion Beam Lithographically Patterned Fe Thin Films, article, November 9, 2008; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc900144/: accessed June 22, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.