An analysis of the x-ray linear dichroism spectrum for NiO thin films grown on vicinal Ag(001)

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Antiferromagnetic (AFM) NiO thin films are grown epitaxially on vicinal Ag(118) substrate and investigated by x-ray linear dichroism (XLD). We find that the NiO AFM spin exhibits an in-plane spin reorientation transition from parallel to perpendicular to the step edges with increasing the NiO film thickness. In addition to the conventional L{sub 2} adsorption edge, x-ray linear dichroism (XLD) effect at the Ni L{sub 3} adsorption edge is also measured and analyzed. The result identifies a small energy shift of the L{sub 3} peak. Temperature-dependent measurement confirms that the observed XLD effect in this system at the normal incidence of ... continued below

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Wu, Y. Z.; Zhao, Y.; Arenholz, E.; Young, A. T.; Sinkovic, B. & Qiu, Z. Q. May 10, 2008.

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Antiferromagnetic (AFM) NiO thin films are grown epitaxially on vicinal Ag(118) substrate and investigated by x-ray linear dichroism (XLD). We find that the NiO AFM spin exhibits an in-plane spin reorientation transition from parallel to perpendicular to the step edges with increasing the NiO film thickness. In addition to the conventional L{sub 2} adsorption edge, x-ray linear dichroism (XLD) effect at the Ni L{sub 3} adsorption edge is also measured and analyzed. The result identifies a small energy shift of the L{sub 3} peak. Temperature-dependent measurement confirms that the observed XLD effect in this system at the normal incidence of the x-rays originates entirely from the NiO magnetic ordering.

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  • Journal Name: PHYSICAL REVIEW B; Journal Volume: 78

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  • Report No.: LBNL-961E
  • Grant Number: DE-AC02-05CH11231
  • DOI: 10.1103/PhysRevB.78.064413 | External Link
  • Office of Scientific & Technical Information Report Number: 937504
  • Archival Resource Key: ark:/67531/metadc897118

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  • May 10, 2008

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  • Sept. 27, 2016, 1:39 a.m.

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  • Jan. 4, 2017, 4:45 p.m.

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Wu, Y. Z.; Zhao, Y.; Arenholz, E.; Young, A. T.; Sinkovic, B. & Qiu, Z. Q. An analysis of the x-ray linear dichroism spectrum for NiO thin films grown on vicinal Ag(001), article, May 10, 2008; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc897118/: accessed December 12, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.